CDK offers wide range of evaluation and analysis to meet our customers' needs.
We provide the immediate & flexible service such as electrical measurement, visual inspection (x-ray, SEM, EDS…), chemical etch and so on.
Observing Equipment
Stereomicroscope
Purpose | Expanding the observation image by stereomicroscope. |
---|---|
Method |
|
Equipment |
|
Metallograph
Purpose | Expanding the observation image by metallograph. |
---|---|
Method |
|
Equipment |
|
Digital Microscope
Purpose | Expanding the observation image by digital microscope. |
---|---|
Method |
|
Equipment |
|
Measuring Equipment
Laser Microscope
Purpose | Observing the image by scanning the laser. |
---|---|
Method |
|
Equipment |
|
X-ray Fluorescence Thickness Meter
Purpose | Measuring thickness and elemental ratio of films. |
---|---|
Method |
|
Equipment |
|
Inside Inspection
X-ray Analysis Equipment
Purpose | Taking the fluoroscopic image to observe the inside. |
---|---|
Method |
|
Equipment |
|
IComponent Analysis
SEM/EDS
Purpose | Taking the image and analyzing the component. |
---|---|
Method |
|
Equipment |
|
ex)component analysis by EDS: interface of solder
Device Processing
Ion Milling
Purpose | Polishing the surface of the device by noble gas beam. |
---|---|
Method |
|
Equipment |
|
Chemical Etching
Purpose | Etching the plastic package by using mixed acid. |
---|---|
Method | By difference of plastic composition, the state of dissolving is different. so it may be necessary to do pretest. Please ask us in advance. |