CDK offers wide range of evaluation and analysis to meet our customers' needs.
We provide the immediate & flexible service such as electrical measurement, visual inspection (x-ray, SEM, EDS…), chemical etch and so on.
![](../../../img/products/shinraisei/kaiseki/img_01.jpg)
Observing Equipment
Stereomicroscope
Purpose | Expanding the observation image by stereomicroscope. |
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Metallograph
Purpose | Expanding the observation image by metallograph. |
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Digital Microscope
Purpose | Expanding the observation image by digital microscope. |
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Measuring Equipment
Laser Microscope
![Laser Microscope](../../../img/products/shinraisei/kaiseki/img_02.jpg)
Purpose | Observing the image by scanning the laser. |
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X-ray Fluorescence Thickness Meter
![X-ray Fluorescence Thickness Meter](../../../img/products/shinraisei/kaiseki/img_03.jpg)
Purpose | Measuring thickness and elemental ratio of films. |
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Inside Inspection
X-ray Analysis Equipment
![X-ray Analysis Equipment](../../../img/products/shinraisei/kaiseki/img_04.jpg)
Purpose | Taking the fluoroscopic image to observe the inside. |
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IComponent Analysis
SEM/EDS
![SEM/EDS](../../../img/products/shinraisei/kaiseki/img_05.jpg)
Purpose | Taking the image and analyzing the component. |
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ex)component analysis by EDS: interface of solder
![ex)component analysis by EDS: interface of solder](../../../img/products/shinraisei/kaiseki/img_06.jpg)
Device Processing
Ion Milling
![Ion Milling](../../../img/products/shinraisei/kaiseki/img_07.jpg)
Purpose | Polishing the surface of the device by noble gas beam. |
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Chemical Etching
Purpose | Etching the plastic package by using mixed acid. |
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Method | By difference of plastic composition, the state of dissolving is different. so it may be necessary to do pretest. Please ask us in advance. |