CDK has record of manufacturing for high reliability product which used for artificial satellite (space probe), Unmanned resupply spacecraft(HTV) for 40 years, and have been highly appreciated. In the case of spacecraft which returned a sample of material from a asteroid to Earth, we took part in assembly and evaluation of communication devices. We provide integrated operation service for high reliability products.
Test Lineup
| Test Name | Outline | Related Standard |
|---|---|---|
| Screening | Screening of sample which not satisfy requirement. | ー |
| Thermal Shock (Liquid) |
To evaluate durability by changing temperature suddenly in liquid. | MIL-STD-202/750/883 |
| Thermal Shock (Air) |
To evaluate durability by changing temperature suddenly in gas. |
|
| Particle Impact Noise Detection | To check inside contaminants of hollow package. | |
| Hermetic Seal | To check inside contaminants of hollow package. |
|
| Low Temperature Storage | To evaluate durability at low temperature. | |
| Electrical Characteristic in High/Low Temperature | To evaluate drifting of electrical characteristic at high/low temperature. |
Test & evaluation for high reliability product
Thermal Shock Test (liquid)
| Purpose | To evaluate durability by changing temperature suddenly in liquid. |
|---|---|
| Method | Medium water Temperature range (High range) up to 100℃ (Low range) from 0℃ Medium Gulden Temperature range (High range) 70℃ to 200℃ (Low range) -65℃ to 0℃ 【Standards】 |
Thermal Shock Test (air)
| Purpose | To evaluate durability by changing temperature suddenly in gas. |
|---|---|
| Method | Medium air Temperature range (High range) 60℃ to 200℃ (Low range) -70℃ to 0℃ 【Standards】 |
Particle Impact Noise Detection
| Purpose | To check inside contaminants of hollow package. |
|---|---|
| Method |
【Standards】 |
Hermetic Seal
| Purpose | To evaluate airtight of hollow package We can test fine-leak-test using helium gas and gross-leak-test using Fluorinert. |
|---|---|
| Method |
【Standards】 |
Low Temperature Storage Test
| Purpose | To evaluate durability at low temperature. |
|---|---|
| Method |
【Equipment】  |
Electrical characteristic at high/low temperature
| Purpose | To evaluate drifting of electrical characteristic at high/low temperature. |
|---|---|
| Method | Temperature range (High range) up to 200℃ (Low range) from -60℃ CDK possibles to measure DC and RF characteristic.  |
