Testing Technology

From evaluating performance for device development, until final testing after assembling, CDK offers a full range of RF test technology to meet our customers' needs.

Testing Technology for RF

・Low-noise HEMT, High power FET for base station, Wireless LAN switch IC have tested.
・Have a rich experience and record about high throughput and high quality test.

Shield Room

20GHz Bands Testing System
　S-Parameter Tester/Handler
　Exclusive RF Test Fixture

Testing Record

・ Test system covered device for smartphone, GPS, DBS/CS etc.
・ Designing in-house tester, test fixture and Probe Card for optimized testing.

In-house Tester

・ Tester Lineup
　HP84000 (Agilent)
　 TS-1000/6900/6900S (Yokokawa)
　 EM (TOKYO SEIMITSU)
　 VX-4000 (Teknologue)
　 SM-2106B (Kokuyo)

・ In-house production
　 Testing unit
　 (RF Switching Box, Signal branching filter, etc.)
　 Automatic test control system
　 Reducing test time by coincidence measurement

ID-250 RF Tester

RF Switching Box

Designing Probe Card/ Test Fixture

・Designing high quality test fixture by electrical simulation in-house.
・Track records are 150um pitch RF probe card for WLCSP, RF Test Fixture for 20GHz Bands, etc.

RF Probe Card for WLCSP

RF Test Fixture for 20GHz Bands